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CpK - A Living Paper

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This living paper developed and maintained by Kim Niles, was featured under "Quality Web Watch" of Quality Progress Magazine, March 2001; page 22.  

 

This is a living paper in that any related comments, definitions, or stories you submit to us using the on-line form below will be added as appropriate and you will be featured in the reference section at the bottom.     

 

Jump Below to:

How To Measure?

What To Measure

CpK Formulas

What's Out of Spec?

When To Measure

Why Measure?

Change/Comment Submission form

Advanced Cpk Notes

Capability Index Definitions  

Related article: "The Process Performance Metric Pp" Process Control Using Capability Indices
Using non-normal data

Why Measure?

 

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Once a process is under control the question arises, "to what extent does the long-term performance of the process comply with engineering requirements or managerial goals?" In more general terms, the question is, "how capable is our process (or supplier's process) in terms of producing items within the specification limits?" 

Process capability measurements allow us to summarize the process capability in terms of meaningful percentages and indices. While control charts demonstrate the reproducibility of the process, CpK demonstrates the effectiveness of the process.

CpK = Process Capability with Kurtosis (pointedness)


CpK measurements are almost always beneficial. Some reasons to determine supplier CpK measurements are as follows:

  1. To set realistic cost effective part specifications based upon the customer's needs and the costs associated by the supplier at meeting those needs.

  2. To understand and or predict hidden supplier costs. Suppliers may not know or hide their natural free capability limits in an effort to keep business. This could mean that unnecessary costs could occur such as a sorting or improvement efforts made to meet process factors that already in actuality meet customer needs.

  3. To be pro-active. For example, a CpK made using injection molding barrel temperature measurements may help reveal a faulty heating element about to break before part measurements vary out of spec. The same CpK may help reveal special causes of variation such as doors left open next to the machine where cool incoming air contributes to process variation.  CpK is not a substitute for SPC but when one point in time is desired, CpK is as good tool.  

  4. To save time and costs during problem solving. The CpK is a measurement of what a process is fully capable of producing. Problem solving situations when parts are measured out of specification may be easily understood with a quick comparison of the measurements against the process CpK.


How to Measure

 

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The software package Statistica lists the following edited information regarding Cpk:   Most of the procedures and indices described here were only recently introduced to the US by Ford Motor Company (Kane, 1986). They allow us to summarize the process capability in terms of meaningful percentages and indices.

To calculate a process CpK, follow the instructions for either formula below.

 


Formulas

 

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Formula 1 of 2

Here is simple formula from net-citizen Keith Laubscher:
Cpk = the smaller value of Cpu or Cpl
Cpu = (Upper spec limit - x)/(3s)
Cpl = (x - lower spec limit)/3s
where x = average, s= sigma (standard deviation from calculator or spreadsheet)

Formula 2 of 2

The following page is of Kim's notes from a two day seminar put on by Allied Signal for it's vendors and taught by Keki R. Bhote (author of Supply management: How to Make U.S. Suppliers Competitive, World Class Quality, Beyond Customer Satisfaction to Customer Loyalty: The Key to Greater Profitability, and others).

To calculate the process CpK, one figures out formula #1, then #2, then #3. CpK values of 1.33 or greater are considered to be stable as an "industry standard". This means that the process is contained within four standard deviations of the process specifications. See other notes below the examples.

Calculating the CpK


What to Measure

 

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CpK's for all CRITICAL PRODUCT MEASUREMENTS deemed important by the customer should be produced at the beginning of the initial production to determine expected production costs and general ability to meet the customer's specifications. Then from time to time over the life of the production process, CpK's should be re-generated for comparison and to look for potential problems with tool wear, operators in need of training, etc.

CpK's for CRITICAL PROCESS FACTOR MEASUREMENTS are often as important as they may be critical in controlling important aspects of the product. 

Process width for these formulas are calculated with the assumptions that all data comes from a normal distribution and with an even distribution of error. Therefore, the best quick way to calculate the process width is to multiply the standard deviation of the process by 3 to 4.

When calculating the CpK keep in mind that it is only as accurate as the data used to calculate it. Care should be made as possible to acquire data over the range of all natural variation, considering the following possibilities:

1.      Part variation:  piece-to-piece, raw material lot-to-lot, etc. 

2.      Tooling variation: cavity-to-cavity, tool-to-tool, wear over time, etc.

3.      Human variation: operator-to-operator variation, supervisor-to-supervisor, number of other tasks performed at the same time, etc.

4.      Time variation:  shift to shift, day-to-day, week-to-week, month-to-month, season-to-season, year-to-year variation, etc.

5.      Location variation:  machine to machine, building-to-building, plant-to-plant, state-to-state, country to country, etc.

 


Advanced CpK Notes

 

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Computer programs such as Stat Graphics 4.0 (plots shown below) allow for plotting and additional information to be obtained. For example, the following CpK could have come from a pre-production lot made by an anxious to please vendor that enabled the following information to be determined:

  1. The lot was sorted at the 3.0 measurement based upon the high side non-normal overall left skewed data truncated at the 3.0 measurement area.

  2. The lot received is of a bi-modal distribution typical of sorted lots where the majority of unsure parts got thrown into the good pile and many good parts get measured as bad.

  3. The lot was sorted 100% based on the same patterns, some calculations, the lack of out liers, and the bi-nomial distribution.

  4. Much can be determined about how the sorting took place (i.e. visual, no-go gage, etc. as opposed to an accurate measurement).

  5. Through calculation that 0.0000% of the lot are likely to exceed the more important 3.75 measurement at the 95% confidence level.

  6. Through calculation that 8.05% of the lot are likely to exceed the lower 2.4 specification at the 95% confidence level.

  7. The lot was not sorted for the lower specification due to the data in that region being normally distributed (see normal distribution plot below).

  8. Other details such as the probability of measurements at all points within the specification and what the ideal specification for the vendor would be can easily be calculated.

From this example, it would be beneficial for the customer and the vendor to sit down and work out either a process improvement program and or specification changes so that cost, quality, delivery, and profitability would improve for both parties.

Bimodal CpK

Normal Plot


This plot above shows all the data points and how the data at the low end of the specification is normally distributed as it follows the line well.

Summary Statistics for MR092299

Count = 83
Average = 2.67145
Median = 2.64
Mode =
Geometric mean = 2.66441
Variance = 0.037654
Standard deviation = 0.194046
Standard error = 0.0212994
Minimum = 2.25

Maximum = 2.98

Range = 0.73
Lower quartile = 2.52
Upper quartile = 2.85
Interquartile range = 0.33
Skewness = -0.138101
Stnd. skewness = -0.513641
Kurtosis = -1.02187
Stnd. kurtosis = -1.90033
Coeff. of variation = 7.26372%
Sum = 221.73

Confidence Intervals for MR092299
95.0% confidence interval for mean: 2.67145 +/- 0.0423713 [2.62907,2.71382]
95.0% confidence interval for standard deviation: [0.168354,0.229065]


When To Measure

 

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If SPC is not in use then both product and process Cpk measurements should be completed prior to production release.  From time to time over the life of the production process CpK's should be re-generated for comparison and to look for potential problems with tool wear, operators in need of training, etc.

 


Capability Index Definitions

 

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The ASQ glossary defines the following measures as follows:

Cp: The ratio of tolerance to six sigma, or the USL (upper specification limit) minus the LSL (lower specification limit) divided by six sigma. It is sometimes referred to as the engineering tolerance divided by the natural tolerance and is only a measure of dispersion.

Cpk index: Equals the lesser of the USL minus the mean divided by three sigma (or the mean) minus the LSL divided by three sigma. The greater the Cpk value, the better.


What's Out of Specification?

 

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The following table was put together from six different sources that didn't match up 100% but is believed to be accurate enough for most purposes.   The chart shows 0.002 PPM = 6 sigma process = 99.9999996% yield in if centered in side two specs with 6 sigma distance gap between the process mean and the specifications. 

 

Six Sigma means two things these days in industry.  To statisticians "six sigma" with small letters means a measurement of process capability six times the standard deviation of the process from the mean of that process to the nearest specification when centered.   The other meaning for "Six Sigma" with capitol letters has is a type of management system developed by Motorola in 1982 using statistics to measure all important metrics in the same way but in terms of defects per opportunity and while allowing a 1.5x process shift.    The 6 sigma box on the right shows the 1.5x sigma shift.  Other Six Sigma calculators can be found on Tom Pyzdek's site at the bottom of his home page at:  http://www.pyzdek.com and the one on the isixsigma.com site

 

 

Assumptions of normally distributed data and even distributions of error apply.


Process Control Using Capability Indices  

 

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Generating Cp or CpK values are in essence pictures of process capability at one point in time. They are simple ratios. However, several process capability values taken from a process over a period of time can be used to control a process (Dr. Fred Spring 1991, JQT or QE?).   The
formula recommended by Spring is Cpm = (USL - LSL)/6 sqrt([s/c4]^2 +[n[m-T]^2/(n-1)]).  The s and m are for the sample, m is the mean, T is the target. You plot the Cpm values for each sample.

One interesting fact regarding process capability index values is that they tend to follow the Chi-square distribution even if they are each taken from process data that follows a normal distribution. Therefore, calculating confidence or control limits for capability indices require different formulas and considerations relative to using z score or SPC methods that are often considered during typical process control initiatives (Chuo, 1990).


Using non-normal data  

 

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Using Cpk indices can be problematic in general and for non-normal distributions it is even more so.  There are several capability indices for non-normal distributions.  Here are a few:

  1. Johnson curve estimates

  2. Pearn estimates (replaces the mean with the median)

  3. ISO technical committee 69 formula

  4. Montgomery's Cp(q)

  5. Luceno's Cpc

  6. Flaig's [NC, NS] estimate (the non-conformance rate
    and net sensitivity)

You can find information on 4 & 5 in Montgomery's text on SPC (see reference #9 below).  Bothe's book "Measuring Process Capability" covers most of the metrics well.  You can find information on [NC, NS] at www.e-AT-USA.com in the DEMO section.

If you have additional questions, please e-mail John J. Flaig, Ph.D.


References & Related Article Links

 

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  1. Personal Experience of Kim Niles

  2. Net-citizens Keith Laubscher and Mark Chaney.

  3. Bhote, Keki and Adi. (2000).  "World Class Quality – Using Design of Experiments to Make it Happen". American Management Association. NY. 

  4. Plots were generated using Stat Graphics 4.0 Software or MS Excel

  5. The help feature of Statistica

  6. CpK Article at isixsigma.com

  7. Several small changes by section officer Hank Posters.

  8. ASQ glossary

  9. Montgomery, Douglas. C. "Introduction to Statistical Quality Control". Wiley & Sons, Inc. New York. 2001.

  10. Bothe.  "Measuring Process Capability" ... more here soon

  11. John J. Flaig, Ph.D. and his site at www.e-AT-USA.com


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  Sunday April 20, 2008 

 

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